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J. Schwestka:
"Ion beam spectroscopy of 2D materials";
Vortrag: Seminar Institut für Allgemeine Physik (IAP), TU Wien; 23.10.2018.

Materials with a thickness of only one atomic layer attracted the attention of theoretical as well as
experimental scientist since their first discovery. Due to their unique electronic and optical properties and
their high flexibility, 2D materials rapidly made their way as promising candidates into various fields of
applications. As a result, more and more monolayer materials are appearing, whereas still their properties
have to be investigated in more detail. With an ion beam spectrometer, charge and energy transfer
between highly charged ions and monolayer materials with different properties are measured. Therefore,
the response of semi-metal graphene as well as semiconducting molybdenum disulfide to a strong and
localized electric field can be probed.