Doctor's Theses (authored and supervised):
B. Ullmann:
"Mixed Negative Bias Temperature Instability and Hot-Carrier Stress";
Supervisor, Reviewer: T. Grasser, J. Schmitz, S. Reggiani;
Institut für Mikroelektronik,
2018;
oral examination: 2018-06-28.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2018.57328
Electronic version of the publication:
http://www.iue.tuwien.ac.at/phd/ullmann/
Created from the Publication Database of the Vienna University of Technology.