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Publications in Scientific Journals:

A. Makarov, S. E. Tyaginov, B. Kaczer, M. Jech, A. Chasin, A. Grill, G. Hellings, M. I. Vexler, D. Linten, T. Grasser:
"Analysis of the Features of Hot-Carrier Degradation in FinFETs";
Semiconductors (Physics of Semiconductor Devices), 52 (2018), 10; 1177 - 1182.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1134/S1063782618100081

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Makarov_1.pdf


Created from the Publication Database of the Vienna University of Technology.