Doctor's Theses (authored and supervised):
G. Rescher:
"Behavior of SiC-MOSFETs under Temperature and Voltage Stress";
Supervisor, Reviewer: T. Grasser, P. Hadley, J. Cooper;
Institut für Mikroelektronik,
2018;
oral examination: 2018-11-13.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2018.60783
Electronic version of the publication:
http://www.iue.tuwien.ac.at/phd/rescher/
Created from the Publication Database of the Vienna University of Technology.