Publications in Scientific Journals:
R. Stradiotto, G. Pobegen, C. Ostermaier, T. Grasser:
"Characterization of Charge Trapping Phenomena at III-N/Dielectric Interfaces";
Solid-State Electronics,
125
(2016),
142
- 153.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.sse.2016.07.017
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Stradiotto_1.pdf
Created from the Publication Database of the Vienna University of Technology.