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F. Huemer, T. Polzer, A. Steininger:
"Using a Duplex Time-to-Digital Converter for Metastability Characterization of an FPGA";
in: "2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)", herausgegeben von: IEEE CS Press; IEEE Xplore Digital Library, 2018, ISBN: 978-1-5386-5754-6, S. 141 - 146.

In view of the increasing number of clock domains found in modern ASICs, the precise characterization of metastability at their boundaries becomes crucial. In some cases, the conventional approach does not provide a sufficient level of detail information. As an alternative approach, the use of a time-to digital
converter based on a tapped delay line has been proposed. In this paper we extend the latter by an additional tapped delay line thus allowing to further refine the concept. We present the underlying concept, its implementation, as well as experimental measurements on an FPGA platform that reveals significant variations in the metastable behavior of different FPGA boards of the same type.

metastability, time-to-digital converter, TDC, late transition detection, carry chain

http://dx.doi.org/10.1109/DDECS.2018.00032