Publications in Scientific Journals:
M. Jech, B. Ullmann, G. Rzepa, S. E. Tyaginov, A. Grill, M. Waltl, D. Jabs, C. Jungemann, T. Grasser:
"Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory";
IEEE Transactions on Electron Devices,
66
(2019),
1;
241
- 248.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2018.2873421
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Jech_1.pdf
Created from the Publication Database of the Vienna University of Technology.