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Publications in Scientific Journals:

W. Gös, Y. Wimmer, A.-M. El-Sayed, G. Rzepa, M. Jech, A. Shluger, T. Grasser:
"Identification of Oxide Defects in Semiconductor Devices: A Systematic Approach Linking DFT to Rate Equations and Experimental Evidence";
Microelectronics Reliability, 87 (2018), 286 - 320.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2017.12.021

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Goes_1.pdf


Created from the Publication Database of the Vienna University of Technology.