M.N. Durakbasa, J.M. Bauer, G. Bas, L. Kräuter:
"Towards a sophisticated approach to cost oriented automation and intelligent metrology in the advanced manufacturing";
Elsevier ScienceDirect IFAC-PapersOnLine, 1 (2018), 51-30; S. 54 - 59.

Kurzfassung englisch:
The manufacturing industry faces currently and in the near future due to the information society, very important challenges. New data, network, automation, digital customer interfaces blow up the existing value chain. The production of nanoscale workpieces requires integration of a high level of quality in conformance with manufacturing processes and micro-/nanometrological assessment and evaluation. Nanotechnology is multidisciplinary in nature. Modern production metrology and its industrial application started on the basis of the scientific, technical and organisational work of E. Abbe, William Taylor and Frederick Winslow Taylor and at the end of the twentieth century - the "Quality Control Century" - the development has reached Nanotechnology and is proceeding to Pico- and Femto-technology. To meet highlevel demands both from industrial and from private customers in the future, manufacturing enterprises must be flexible and agile enough to respond quickly to product demand changes also according technological developments especially in the field of precision engineering at micro, nano and pico scale production. With support of AI and modern IT, it is possible to realise modern cost-effective customerdriven design and manufacturing.

advanced production, integrated management systems, intelligent quality system, intelligent metrology, robotics

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