Publications in Scientific Journals:
S. E. Tyaginov, A. Makarov, B. Kaczer, M. Jech, A. Chasin, A. Grill, G. Hellings, M. I. Vexler, D. Linten, T. Grasser:
"Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs";
Semiconductors (Physics of Semiconductor Devices),
52
(2018),
13;
1738
- 1742.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1134/S1063782618130183
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/JB2018_Tyaginov_2.pdf
Created from the Publication Database of the Vienna University of Technology.