Publications in Scientific Journals:
B. Ullmann, K. Puschkarsky, M. Waltl, H. Reisinger, T. Grasser:
"Evaluation of Advanced MOSFET Threshold Voltage Drift Measurement Techniques";
IEEE Transactions on Device and Materials Reliability,
19
(2019),
2;
358
- 362.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2019.2909993
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Ullmann_1.pdf
Created from the Publication Database of the Vienna University of Technology.