Talks and Poster Presentations (with Proceedings-Entry):
S. E. Tyaginov, M. Jech, G. Rzepa, A. Grill, A.-M. El-Sayed, G. Pobegen, A. Makarov, T. Grasser:
"Border Trap Based Modeling of SiC Transistor Transfer Characteristics";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
2018-10-07
- 2018-10-11; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2018),
ISBN: 978-1-5386-6039-3.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2018.8727083
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.