Talks and Poster Presentations (with Proceedings-Entry):
M. Vandemaele, B. Kaczer, Z. Stanojevic, S. E. Tyaginov, A. Makarov, A. Chasin, H. Mertens, D. Linten, G Groeseneken:
"Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
2018-10-07
- 2018-10-11; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2018),
ISBN: 978-1-5386-6039-3.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2018.8727081
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Vandemaele_1.pdf
Created from the Publication Database of the Vienna University of Technology.