Talks and Poster Presentations (with Proceedings-Entry):
A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, A. Grill, M. Vandemaele, G. Hellings, A.-M. El-Sayed, T. Grasser, D. Linten, S. E. Tyaginov:
"Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2019-03-31
- 2019-04-04; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2019),
ISBN: 978-1-5386-9504-3.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2019.8720584
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Makarov_1.pdf
Created from the Publication Database of the Vienna University of Technology.