Talks and Poster Presentations (with Proceedings-Entry):
M. Vandemaele, B. Kaczer, S. E. Tyaginov, Z. Stanojevic, A. Makarov, A. Chasin, E. Bury, H. Mertens, D. Linten, G Groeseneken:
"Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2019-03-31
- 2019-04-04; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2019),
ISBN: 978-1-5386-9504-3;
1
- 7.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2019.8720406
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Vandemaele_2.pdf
Created from the Publication Database of the Vienna University of Technology.