Talks and Poster Presentations (with Proceedings-Entry):
A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A.-M. El-Sayed, M. Jech, T. Grasser, D. Linten, S. E. Tyaginov:
"Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants";
Talk: European Solid-State Device Research Conference (ESSDERC),
Krakow, Poland;
2019-09-23
- 2019-09-26; in: "Proceedings of the European Solid-State Device Research Conference (ESSDERC)",
(2019),
ISBN: 978-1-7281-1539-9;
262
- 265.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ESSDERC.2019.8901721
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Makarov_3.pdf
Created from the Publication Database of the Vienna University of Technology.