H. Ceric, H. Zahedmanesh, K. Croes:
"Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods";
Vortrag: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 23.09.2019 - 26.09.2019.