Publications in Scientific Journals:
H. Ceric, H. Zahedmanesh, K. Croes:
"Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods";
Microelectronics Reliability,
100-101
(2019),
113362.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2019.06.054
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2019_Ceric_1.pdf
Created from the Publication Database of the Vienna University of Technology.