[Back]


Talks and Poster Presentations (with Proceedings-Entry):

V. Rathore, V. Chaturvedi, A. K. Singh, T. Srikanthan, M. Shafique:
"Towards Scalable Lifetime Reliability Management for Dark Silicon Manycore Systems";
Talk: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rhodes, Greece; 2019-07-01 - 2019-07-03; in: "Proceeding of 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS'19)", IEEE, (2019), ISBN: 978-1-7281-2490-2; 204 - 207.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IOLTS.2019.8854454


Created from the Publication Database of the Vienna University of Technology.