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Zeitschriftenartikel:

M.N. Durakbasa, G. Bas:
"From Nano- to Pico- to Femto-: Future Challenges for Cost-Oriented Manufacturing";
Elsevier ScienceDirect IFAC-PapersOnLine, 1 (2019), Volume 52, Issue 25; S. 382 - 386.



Kurzfassung englisch:
The need for new high precision and innovative manufacturing techniques is indispensable to
provide cost-oriented manufacturing with high accuracy especially at the nano scale production concurrent with the latest developments from nano to pico and femto technologies. Advanced technology applications with a broad range of areas and products have been focusing on micro-, nano- and femto-technology developments by means of the multi-disciplinary expertise. The advanced manufacturing industry integrating the intelligent automation solutions requires intelligent quality system for their operation. Metrology as the measurement science provides the functional methodology for quality control under the defined specifications and standards. The development and integration of advanced production and metrology technologies, which are driven by digitization, information and communication applications from design to manufacturing and service, provide cost-oriented manufacturing with the increasing quality of the products and processes in the new era "Industrie 4.0". The focus is on a framework of comprehensive and appropriate strategies and models that meet the requirements of an integrated management system to meet the challenges of continuous improvement.

Schlagworte:
Production, high precision, quality, cost oriented manufacturing, machine intelligence, automation, Industrie 4.0, education


"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.ifacol.2019.12.557


Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.