Talks and Poster Presentations (with Proceedings-Entry):
M. Jech, S. Tyaginov, B. Kaczer, J. Franco, D. Jabs, C. Jungemann, M. Waltl, T. Grasser:
"First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco , USA;
2019-12-07
- 2019-12-11; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2019).
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM19573.2019.8993630
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Jech_1.pdf
Created from the Publication Database of the Vienna University of Technology.