Publications in Scientific Journals:
K. Giering, K. Puschkarsky, H. Reisinger, G. Rzepa, G.A. Rott, R. Vollertsen, T. Grasser, R. Jancke:
"NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling";
IEEE Transactions on Electron Devices,
66
(2019),
4;
1662
- 1668.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2019.2901907
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2020_Giering_1.pdf
Created from the Publication Database of the Vienna University of Technology.