Publications in Scientific Journals:
Z. Wu, J. Franco, A. Vandooren, B. Kaczer, Ph. Roussel, G. Rzepa, T. Grasser:
"Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration";
IEEE Transactions on Device and Materials Reliability,
9
(2019),
2;
262
- 267.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2019.2906843
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2020_Wu_1.pdf
Created from the Publication Database of the Vienna University of Technology.