Publications in Scientific Journals:
J. Franco, Z. Wu, G. Rzepa, L. Ragnarsson, H. Dekkers, A. Vandooren, G Groeseneken, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
"On the Impact of the Gate Work-Function Metal on the Charge Trapping Component of NBTI and PBTI";
IEEE Transactions on Device and Materials Reliability,
19
(2019),
2;
268
- 274.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TDMR.2019.2913258
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/JB2020_Franco_1.pdf
Created from the Publication Database of the Vienna University of Technology.