Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, Z. Wu, G. Rzepa, L. Ragnarsson, H. Dekkers, A. Vandooren, G. Groeseneken, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
"On the Impact of the Gate Metal Work-Function on the Charge Trapping Component of BTI";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, USA;
2018-10-07
- 2018-10-11; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2018),
ISBN: 978-1-5386-6039-3;
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2018.8727089
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2018/CP2018_Franco_2.pdf
Created from the Publication Database of the Vienna University of Technology.