Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, Z. Wu, G. Rzepa, A. Vandooren, H. Arimura, D. Claes, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
"Low Thermal Budget Dual-Dipole Gate Stacks Engineered for Sufficient BTI Reliability in Novel Integration Schemes";
Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM),
Singapore (invited);
2019-03-12
- 2019-03-15; in: "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)",
(2019),
ISBN: 978-1-5386-6508-4;
215
- 217.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/EDTM.2019.8731237
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Franco_1.pdf
Created from the Publication Database of the Vienna University of Technology.