Talks and Poster Presentations (with Proceedings-Entry):
B. O´Sullivan, R. Ritzenthaler, G. Rzepa, Z. Wu, E. D. Litta, O. Richard, T. Conard, V. Machkaoutsan, P. Fazan, C. Kim, J. Franco, B. Kaczer, T. Grasser, A. Spessot, D. Linten, N. Horiguchi:
"Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-κ/Metal Gate Devices";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Monterey, CA, USA;
2019-03-31
- 2019-04-04; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2019),
ISBN: 978-1-5386-9504-3;
1
- 8.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2019.8720598
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_OSullivan_1.pdf
Created from the Publication Database of the Vienna University of Technology.