A. Shah, M. Waltl:
"Bias Temperature Instability Aware and Soft Error Tolerant Radiation Hardened 10T SRAM";
Electronics, 9 (2020), 2; S. 256-1 - 256-12.
http://dx.doi.org/10.3390/electronics9020256Elektronische Version der Publikation:
http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_1.pdf