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Publications in Scientific Journals:

A. Shah, M. Waltl:
"Bias Temperature Instability Aware and Soft Error Tolerant Radiation Hardened 10T SRAM";
Electronics, 9 (2020), 2; 256-1 - 256-12.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.3390/electronics9020256

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_1.pdf


Created from the Publication Database of the Vienna University of Technology.