Publications in Scientific Journals:
A. Shah, M. Waltl:
"Bias Temperature Instability Aware and Soft Error Tolerant Radiation Hardened 10T SRAM";
Electronics,
9
(2020),
2;
256-1
- 256-12.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.3390/electronics9020256
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_1.pdf
Created from the Publication Database of the Vienna University of Technology.