Talks and Poster Presentations (with Proceedings-Entry):
D. Kohl, C. Kerschner, P. Mesquida, G. Schitter:
"Increasing the SNR of Electrical AFM Methods by Active Mechanical Q-control";
Talk: Joint Conference 8th IFAC Symposium on Mechatronic Systems (MECHATRONICS 2019), and 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019),
- 09-06-2019; in: "Proceedings of the Joint Conference 8th IFAC Symposium on Mechatronic Systems (MECHATRONICS 2019), and 11th IFAC Symposium on Nonlinear Control Systems (NOLCOS 2019)",
This paper investigates the benefit of active mechanical Q-control for electrical surface potential measurements in atomic force microscopy. The effective quality-factor of the electrically stimulated cantilever oscillation is additionally increased mechanically at the same frequency with an active analog Q-controller, while in lift-mode. It is shown experimentally that the cantilever oscillation amplitude and therefore the measurement sensitivity is improved by a factor of 15. By spectral noise analysis around the resonance frequency of the cantilever, an increase of the signal-to-noise ratio from 2.5dB to 23dB is achieved.
AFM, electric measurement modes, Q-control, SNR
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
Created from the Publication Database of the Vienna University of Technology.