Talks and Poster Presentations (with Proceedings-Entry):
B. Stampfer, M. Simicic, P. Weckx, A. Abbasi, B. Kaczer, T. Grasser, M. Waltl:
"Statistical Characterization of BTI and RTN using Integrated pMOS Arrays";
Talk: IEEE International Integrated Reliability Workshop (IIRW),
South Lake Tahoe, CA, USA;
2019-10-13
- 2019-10-17; in: "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)",
(2019),
1
- 5.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW47491.2019.8989904
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Stampfer_1.pdf
Created from the Publication Database of the Vienna University of Technology.