Talks and Poster Presentations (with Proceedings-Entry):
S. Tyaginov, A. El-Sayed, A. Makarov, A. Chasin, H. Arimura, M. Vandemaele, M. Jech, E. Capogreco, L. Witters, A. Grill, A. De Keersgieter, G. Eneman, D. Linten, B. Kaczer:
"Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA;
2019-12-07
- 2019-12-11; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2019),
ISBN: 978-1-7281-4032-2;
498
- 501.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM19573.2019.8993644
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Tyaginov_3.pdf
Created from the Publication Database of the Vienna University of Technology.