Publications in Scientific Journals:
A. Shah, D. Rossi, V. Sharma, S. Vishvakarma, M. Waltl:
"Soft Error Hardening Enhancement Analysis of NBTI Tolerant Schmitt Trigger Circuit";
Microelectronics Reliability,
107
(2020),
113617.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2020.113617
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Shah_4.pdf
Created from the Publication Database of the Vienna University of Technology.