Books and Book Editorships:
L. Burgueño, A. Pretschner, S. Voss, M. Chaudron, J. Kienzle, M. Völter, S. Gérard, M. Zahedi, E. Bousse, A. Rensink, F. Polack, G. Engels, G. Kappel (ed.):
"22nd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems Companion, MODELS Companion 2019, Munich, Germany, September 15-20, 2019.";
IEEE C.P.S. Publishing Services,
This joint volume of proceedings gathers together papers from the satellite and collocated events with MODELS 2019 including the workshops (listed below), Educators and Doctoral Symposia, and Posters and Tools & Demonstrations sessions. These events were all held during the ACM/IEEE 22nd International Conference on Model Driven Engineering Languages and Systems (MODELS), September 15th- 20th, 2019. MODELS is the premier conference series for model-based software and systems engineering covering all aspects of modeling from languages and methods to tools and applications, and has done so since 1998. The many workshops at MODELS (see the list below) provide devoted meetings for discussion and sharing of ideas relevant to a specific topic. The Tool and Demonstrations event recognizes the importance of tools to MDE, and includes submissions of both industry and research tools. The Posters session provides a venue for researchers to present and receive feedback on early and ongoing projects, innovative applications of existing tools, and ideas for novel applications in the area of MDE. The Doctoral Symposium and ACM Student Research Competition support student research. The Educators Symposium provides a venue for educators interested in MDE to gather to share ideas and discuss relevant topics and trends. The Doctoral Symposium enables young researchers to present receive feedback on their existing and planned research projects from their fellow students and experienced faculty mentors in the area of MDE.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
Electronic version of the publication:
Created from the Publication Database of the Vienna University of Technology.