M. Dopita, D. Rafaja, D. Chmelik, A. Salomon, D.S. Janisch, W. Lengauer:
"Microstructural investigation of hard metals by combination of EBSD and XRD";
Materials Structure, 18 (2011), 3; S. 169 - 177.

Kurzfassung englisch:
A combination of the Electron Backscatter Diffraction (EBSD) and X-ray diffraction (XRD) was used for the investigation of the microstructural properties of hard metals. A set of specimens containing hex-WC and fcc-Ti(C,N) as hard phases and Co (and Ni) as a binder was prepared by vary ing the WC / Ti(C,N) ratio. Due to the combination of a good spatial and angular resolution, the EBSD technique yields unique in formation on the orientation of individual crystallites, on the grain/subgrain morphology, on the grain size distribution, on the misorientation of the grain boundaries, and on the character of the grain boundaries (GBs)
distributions for each individual hard phase present in the sample. Owing to its excellent resolution in reciprocal space, the XRD revealed the distribution of the lattice parameters in the fcc hard-phase grains, from which the composition gradients in the hard phases were calculated using an appropriate microstructure model. This microstructure model was built with the aid of the results obtained from the SEM/EBSD and SEM/EDX investigations.

hardmetals, cemented carbides, cubic phases, titanium carbide, tungsten carbide, metal cutting

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