Publications in Scientific Journals:
B. Stampfer, F. Schanovski, T. Grasser, M. Waltl:
"Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors";
Micromachines (invited),
11
(2020),
4;
446-1
- 446-11.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.3390/mi11040446
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Stampfer_1.pdf
Created from the Publication Database of the Vienna University of Technology.