Contributions to Books:
B. Stampfer, A. Grill, M. Waltl:
"Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals";
in: "Noise in Nanoscale Semiconductor Devices",
T. Grasser (ed.);
Springer International Publishing,
2020,
ISBN: 978-3-030-37499-0,
229
- 257.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/978-3-030-37500-3_7
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/BC2020_Stampfer_1.pdf
Created from the Publication Database of the Vienna University of Technology.