Talks and Poster Presentations (with Proceedings-Entry):
Yu. Illarionov, T. Grasser:
"Reliability of 2D Field-Effect Transistors: from First Prototypes to Scalable Devices";
Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Hangzhou, China (invited);
2019-07-02
- 2019-07-05; in: "Proceedings of the International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)",
(2019),
1
- 6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IPFA47161.2019.8984799
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2019/CP2019_Illarionov_4.pdf
Created from the Publication Database of the Vienna University of Technology.