Talks and Poster Presentations (with Proceedings-Entry):
M. Waltl:
"Defect Spectroscopy in SiC Devices";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual (invited);
2020-04-28; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
1
- 9.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9129539
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Waltl_1.pdf
Created from the Publication Database of the Vienna University of Technology.