Talks and Poster Presentations (with Proceedings-Entry):
J. Michl, A. Grill, D. Claes, G. Rzepa, B. Kaczer, D. Linten, I. Radu, T. Grasser, M. Waltl:
"Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual;
2020-04-28
- 2020-05-30; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
ISBN: 978-1-7281-3199-3;
1
- 6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9128349
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Michl_1.pdf
Created from the Publication Database of the Vienna University of Technology.