Talks and Poster Presentations (with Proceedings-Entry):
A. Grill, E. Bury, J. Michl, S. Tyaginov, D. Linten, T. Grasser, B. Parvais, B. Kaczer, M. Waltl, I. Radu:
"Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual;
2020-04-28
- 2020-04-30; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
ISBN: 978-1-7281-3199-3;
1
- 6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9128316
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Grill_1.pdf
Created from the Publication Database of the Vienna University of Technology.