Talks and Poster Presentations (with Proceedings-Entry):
S. Tyaginov, A. Grill, M. Vandemaele, T. Grasser, G. Hellings, A. Makarov, M. Jech, D. Linten, B. Kaczer:
"A Compact Physics Analytical Model for Hot-Carrier Degradation";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual;
2020-04-28; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
ISBN: 978-1-7281-3199-3;
1
- 7.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9128327
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.