Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, B. Kaczer, B. O´Sullivan, G. Rzepa, B. Stampfer, M. Waltl:
"The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual;
2020-04-28
- 2020-04-30; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
ISBN: 978-1-7281-3200-6;
1
- 6.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9129198
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.