Publications in Scientific Journals:
M. Waltl:
"Reliability of Miniaturized Transistors from the Perspective of Single-Defects";
Micromachines (invited),
11
(2020),
8;
736-1
- 736-21.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.3390/mi11080736
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Waltl_2.pdf
Created from the Publication Database of the Vienna University of Technology.