B. Czerny, G. Khatibi:
"Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method";
Microelectronics Reliability, 114 (2020), 113831; S. 1 - 9.
http://dx.doi.org/10.1016/2020.113831Elektronische Version der Publikation:
https://publik.tuwien.ac.at/files/publik_293357.pdf