Publications in Scientific Journals:
B. Ruch, G. Pobegen, T. Grasser:
"Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping";
IEEE Transactions on Electron Devices,
67
(2020),
10;
4092
- 4098.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2020.3018091
Electronic version of the publication:
https://www.iue.tuwien.ac.at/pdf/ib_2020/JB2020_Ruch_1.pdf
Created from the Publication Database of the Vienna University of Technology.