Zeitschriftenartikel:
M. Stöger-Pollach, S. Löffler, N. Maurer, K. Bukvisová:
"Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence";
Ultramicroscopy,
214
(2020),
113011;
S. 1
- 5.
Kurzfassung englisch:
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on erenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).
"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.ultramic.2020.113011
Erstellt aus der Publikationsdatenbank der Technischen Universität Wien.