Talks and Poster Presentations (with Proceedings-Entry):
A. Kruv, B. Kaczer, A. Grill, M. Gonzalez, J. Franco, D. Linten, W. Goes, T. Grasser, I. De Wolf:
"On the Impact of Mechanical Stress on Gate Oxide Trapping";
Talk: IEEE International Reliability Physics Symposium (IRPS),
Dallas, TX, USA - virtual;
2020-04-28
- 2020-04-30; in: "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)",
(2020),
1
- 5.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS45951.2020.9129541
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2020/CP2020_Kruv_1.pdf
Created from the Publication Database of the Vienna University of Technology.