Talks and Poster Presentations (with Proceedings-Entry):

K. Feichtinger, K. Meixner, R. Rabiser, S. Biffl:
"Variability Transformation from Industrial Engineering Artifacts: An Example in the Cyber-Physical Production Systems Domain";
Talk: Online Conference 24th ACM International Systems and Software Product Line Conference (SPLC 2020), Montreal, Canada; 2020-10-19 - 2020-10-23; in: "Proceedings of the 24th ACM International Systems and Software Product Line Conference - Volume B, Doctoral Symposium", ACM, (2020), ISBN: 978-1-4503-7570-2; 65 - 73.

English abstract:
Many variability modeling approaches have been proposed to explicitly represent the commonalities and variability in (software)
product lines. Unfortunately, practitioners in industry still develop
custom solutions to manage variability of various artifacts, like
requirements documents or design spreadsheets. These customdeveloped variability representations often miss important variability information, e.g., information required to assemble production goods. In this paper, we introduce the Variability Evolution
Roundtrip Transformation (VERT) process. The process enables
practitioners from the Cyber-Physical Production Systems domain
to transform custom-developed engineering variability artifacts to
a feature model, evolve and optimize the model, and transform it
back to the original engineering artifacts. We build on an existing
transformation approach for variability models and show the feasibility of the process using a real-world use case from an industry
partner. We report on an initial feasibility study conducted with our
industry partners´ domain experts and on lessons learned regarding
variability transformation of engineering variability artifacts

Variability Modeling, Feature Extraction, Variability Evolution, CyberPhysical Production System Engineering, CPPS

"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)

Created from the Publication Database of the Vienna University of Technology.