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M. Baer, B. Schmauss, B. Lendl:
"Process as well as a device to the determination of optical characteristics of a sample material";
Patent: Deutschland, Nr. De102019104556 (a1); eingereicht: 21.02.2019.

[Machine Translation of Descriptors]. The invention concerns a process (100), prefers a spectroscopy process, continues to prefer a ATR Infrarotspektroskopieverfahren, for the determination of optical characteristics of a sample material (5), whereby the process (100) comprises subsequent steps: Determine (101) of a first intensity of of the sample material (5) reflected light (3r) of a first polarization state; Determine (102) of a second intensity of the sample material (5) reflected light (3r) of a second polarization state (102); Ratio formation (103) of the first intensity and the second intensity or in reverse. Furthermore the invention concerns a device (1), a spectrometer prefers, continues to prefer an ATR infrared spectrometer, for the determination of optical characteristics of a sample material (5) comprising at least a detector installation (8, 8a, 8b) to the determination of a first intensity of of the sample material (5) reflected light (3r) of a first polarization state and for the determination of a second intensity of the sample material (5) reflected light (3r) of a second polarization state and at least a computer (11) for the ratio formation of the first intensity and the second intensity or in reverse.